Rathish Jayabharathi

Publication Activity (10 Years)

Years Active: 1993-2016
Publications (10 Years): 2

Top Topics

Integer Programming

Top Venues

ACM Trans. Design Autom. Electr. Syst.

Publications

Ahish Mysore Somashekar, Spyros Tragoudas, Rathish Jayabharathi, Sreenivas Gangadhar
Non-enumerative Generation of Path Delay Distributions and Its Application to Critical Path Selection. ACM Trans. Design Autom. Electr. Syst. 22 (1) (2016)
Ahish Mysore Somashekar, Spyros Tragoudas, Rathish Jayabharathi
Non-enumerative correlation-aware path selection. ICCD (2015)
Unni Chandran, Dan Zhao, Rathish Jayabharathi
Hybrid 3D pre-bonding test framework design. ETS (2013)
Ahish Mysore Somashekar, Spyros Tragoudas, Sreenivas Gangadhar, Rathish Jayabharathi
Non-enumerative generation of statistical path delays for ATPG. ICCD (2012)
Mahilchi Milir Vaseekar Kumar, Spyros Tragoudas, Sreejit Chakravarty, Rathish Jayabharathi
Exact At-speed Delay Fault Grading in Sequential Circuits. ITC (2006)
Mahilchi Milir Vaseekar Kumar, Spyros Tragoudas, Sreejit Chakravarty, Rathish Jayabharathi
Exact Delay Fault Coverage in Sequential Logic Under Any Delay Fault Model. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25 (12) (2006)
Mahilchi Milir Vaseekar Kumar, Spyros Tragoudas, Sreejit Chakravarty, Rathish Jayabharathi
Implicit and Exact Path Delay Fault Grading in Sequential Circuits. DATE (2005)
Kee Sup Kim, Rathish Jayabharathi, Craig Carstens
SpeedGrade: An RTL Path Delay Fault Simulator. Asian Test Symposium (2001)
Kee Sup Kim, Rathish Jayabharathi, Craig Carstens, Praveen Vishakantaiah, Derek Feltham, Adrian Carbine
DPDAT: data path direct access testing. ITC (2001)
Rathish Jayabharathi, Manuel A. d'Abreu, Jacob A. Abraham
FzCRITIC - A Functional Timing Verifier Using a Novel Fuzzy Delay Model. VLSI Design (1999)
Rathish Jayabharathi, Kyung Tek Lee, Jacob A. Abraham
A Novel Solution for Chip-Level Functional Timing Verification. VTS (1997)
Abhijit Chatterjee, Rathish Jayabharathi, Pankaj Pant, Jacob A. Abraham
Non-robust tests for stuck-fault detection using signal waveform analysis: feasibility and advantages. VTS (1996)
Rathish Jayabharathi, Thomas Thomas, Earl E. Swartzlander Jr.
A Comparative Evaluation of Adders Based on Performance and Testability. ICCD (1993)