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Non-robust tests for stuck-fault detection using signal waveform analysis: feasibility and advantages.

Abhijit ChatterjeeRathish JayabharathiPankaj PantJacob A. Abraham
Published in: VTS (1996)
Keyphrases
  • fault detection
  • data analysis
  • fault diagnosis
  • industrial processes
  • machine learning
  • fuzzy sets
  • intelligent systems
  • frequency domain
  • condition monitoring