Dwayne Burek

Publication Activity (10 Years)

Years Active: 1992-2006
Publications (10 Years): 0

Publications

Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie
OCI: Open Compression Interface. ITC (2006)
R. Dean Adams, Robert Abbott, Xiaoliang Bai, Dwayne Burek, Eric MacDonald
An Integrated Memory Self Test and EDA Solution. MTDT (2004)
Kazuhiko Iijima, Armagan Akar, Charlie McDonald, Dwayne Burek
Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips. Asian Test Symposium (2002)
Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti
IP and Automation to Support IEEE P1500. VTS (2001)
Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hassan
ScanBist: A Multifrequency Scan-Based BIST Method. IEEE Des. Test Comput. 11 (1) (1994)
Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hassan
ScanBIST: A Multi-frequency Scan-based BIST Method. ITC (1992)