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Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips.

Kazuhiko IijimaArmagan AkarCharlie McDonaldDwayne Burek
Published in: Asian Test Symposium (2002)
Keyphrases
  • database systems
  • multi agent
  • database
  • data mining
  • artificial intelligence
  • data structure
  • test cases
  • statistical tests