ScanBist: A Multifrequency Scan-Based BIST Method.
Benoit Nadeau-DostieDwayne BurekAbu S. M. HassanPublished in: IEEE Des. Test Comput. (1994)
Keyphrases
- high accuracy
- detection method
- preprocessing
- support vector machine
- similarity measure
- fully automatic
- high precision
- synthetic data
- dynamic programming
- computational cost
- mutual information
- evaluation method
- segmentation method
- support vector machine svm
- computationally efficient
- pairwise
- theoretical analysis
- main contribution
- optimization algorithm
- experimental evaluation
- significant improvement
- prior knowledge
- mathematical model
- objective function
- training data