Bruce Cory

Publication Activity (10 Years)

Years Active: 2003-2012
Publications (10 Years): 0

Top Topics

Levels Of Abstraction

Top Venues

IEEE Des. Test Comput.

Publications

Sounil Biswas, Bruce Cory
An Industrial Study of System-Level Test. IEEE Des. Test Comput. 29 (1) (2012)
Cathy Kardach, I. Kapilevich, Jeffrey A. Block, Ted R. Lundquist, Steven Kasapi, J. Liao, Yin S. Ng, Bruce Cory
Foundry workflow for dynamic-EFA-based yield ramp. Microelectron. Reliab. 51 (9-11) (2011)
Joy Y. Liao, Steven Kasapi, Bruce Cory, Howard L. Marks, Yin S. Ng
Scan chain failure analysis using laser voltage imaging. Microelectron. Reliab. 50 (9-11) (2010)
Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie
OCI: Open Compression Interface. ITC (2006)
Roger Nicholson, Cathy Kardach, Bruce Cory
The Role of ATPG Fault Diagnostics in Driving Physical Analysis. ITC (2006)
Bruce Cory
Needs fabless yield ramp foundry partnership to be most successful. ITC (2005)
Steven Kasapi, Bruce Cory
Overcoming Fault Test Coverage with Time-Resolved Emission (TRE) Probing. Microelectron. Reliab. 44 (9-11) (2004)
Bruce Cory, Rohit Kapur, Bill Underwood
Speed Binning with Path Delay Test in 150-nm Technology. IEEE Des. Test Comput. 20 (5) (2003)