Joy Y. Liao

Publication Activity (10 Years)

Years Active: 2005-2020
Publications (10 Years): 1

Top Topics

Integrated Circuit

Digital X Ray Images

Projection Images

Top Venues

Publications

Somayyeh Rahimi, Christian Schmidt, Joy Y. Liao, Howard Lee Marks, Kyung Mo Shin
Impact of X-Ray Radiation on the Reliability of Logic Integrated Circuits. IRPS (2020)
Joy Y. Liao, Steven Kasapi, Bruce Cory, Howard L. Marks, Yin S. Ng
Scan chain failure analysis using laser voltage imaging. Microelectron. Reliab. 50 (9-11) (2010)
Joy Y. Liao, Tung Ton, Nathan Slattengren, Steven Kasapi, William K. Lo, Howard L. Marks, Yin S. Ng, Ted R. Lundquist
Jitter analysis of PLL-generated clock propagation using Jitter Mitigation techniques with laser voltage probing. Microelectron. Reliab. 49 (9-11) (2009)
Joy Y. Liao, Howard L. Marks, F. Beaudoin
OBIRCH analysis of electrically stressed advanced graphic ICs. Microelectron. Reliab. 47 (9-11) (2007)
Joy Y. Liao, G. L. Woods, X. Chen, Howard L. Marks
Localization of Marginal Circuits for Yield Diagnostics Utilizing a Dynamic Laser Stimulation Probing System. Microelectron. Reliab. 45 (9-11) (2005)