Ted R. Lundquist

Publication Activity (10 Years)

Years Active: 2001-2016
Publications (10 Years): 1

Top Topics

Metal Oxide Semiconductor

Integrated Circuit

Spatially Varying

Top Venues

Microelectron. Reliab.

Publications

Marius Rutkauskas, C. Farrell, Christophe Dorrer, Kara L. Marshall, Tom Crawford, Ted R. Lundquist, P. Vedagarbha, K. Erington, D. Bodoh, Derryck Telford Reid
Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light. Microelectron. Reliab. 60 (2016)
Andrea Bahgat Shehata, Alan J. Weger, Franco Stellari, Peilin Song, Hervé Deslandes, Ted R. Lundquist, Euan Ramsay
Time-integrated photon emission as a function of temperature in 32 nm CMOS. IRPS (2015)
Philipp Scholz, Norbert Herfurth, Michael Sadowski, Ted R. Lundquist, Uwe Kerst, Christian Boit
Efficient and flexible Focused Ion Beam micromachining of Solid Immersion Lenses in various bulk semiconductor materials - An adaptive calibration algorithm. Microelectron. Reliab. 54 (9-10) (2014)
Cathy Kardach, I. Kapilevich, Jeffrey A. Block, Ted R. Lundquist, Steven Kasapi, J. Liao, Yin S. Ng, Bruce Cory
Foundry workflow for dynamic-EFA-based yield ramp. Microelectron. Reliab. 51 (9-11) (2011)
Philipp Scholz, Christian Gallrapp, Uwe Kerst, Ted R. Lundquist, Christian Boit
Optimizing focused ion beam created solid immersion lenses in bulk silicon using design of experiments. Microelectron. Reliab. 50 (9-11) (2010)
Rudolf Schlangen, Hervé Deslandes, Ted R. Lundquist, C. Schmidt, Frank Altmann, K. Yu, A. Andreasyan, S. Li
Dynamic lock-in thermography for operation mode-dependent thermally active fault localization. Microelectron. Reliab. 50 (9-11) (2010)
Joy Y. Liao, Tung Ton, Nathan Slattengren, Steven Kasapi, William K. Lo, Howard L. Marks, Yin S. Ng, Ted R. Lundquist
Jitter analysis of PLL-generated clock propagation using Jitter Mitigation techniques with laser voltage probing. Microelectron. Reliab. 49 (9-11) (2009)
Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Ted R. Lundquist, Peter Egger, Christian Boit
Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing. Microelectron. Reliab. 49 (9-11) (2009)
Christian Boit, Rudolf Schlangen, Uwe Kerst, Ted R. Lundquist
Physical Techniques for Chip-Backside IC Debug in Nanotechnologies. IEEE Des. Test Comput. 25 (3) (2008)
Rudolf Schlangen, Uwe Kerst, Christian Boit, Tahir Malik, Rajesh Jain, Ted R. Lundquist
Non destructive 3D chip inspection with nano scale potential by use of backside FIB and backscattered electron microscopy. Microelectron. Reliab. 47 (9-11) (2007)
Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Christian Boit, Rajesh Jain, Tahir Malik, Keneth R. Wilsher, Ted R. Lundquist, Bernd Krüger
Backside E-Beam Probing on Nano scale devices. ITC (2007)
Uwe Kerst, Rudolf Schlangen, A. Kabakow, Erwan Le Roy, Ted R. Lundquist, Siegfried Pauthner
Impact of back side circuit edit on active device performance in bulk silicon ICs. ITC (2005)
Hervé Deslandes, Ted R. Lundquist
Limitations to photon-emission microscopy when applied to "hot" devices. Microelectron. Reliab. 43 (9-11) (2003)
Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah
Fault Localization using Time Resolved Photon Emission and STIL Waveforms. ITC (2003)
Madhumita Sengupta, Lokesh Johri, Chun-Cheng Tsao, Mark Thompson, Ted R. Lundquist
Subresolution placement using IR image to CAD database alignment: an algorithm for silicon-side probing. Image Processing: Algorithms and Systems (2002)
Chun-Cheng Tsao, Bill Thompson, Ted R. Lundquist
Imaging and Material Analysis from Sputter-Induced Light Emission Using Coaxial Ion-Photon Column. Microelectron. Reliab. 42 (9-11) (2002)
G. Dajee, Norman Goldblatt, Ted R. Lundquist, Steven Kasapi, Keneth R. Wilsher
Practical, non-invasive optical probing for flip-chip devices. ITC (2001)
Ted R. Lundquist, E. Delenia, J. Harroun, E. LeRoy, Chun-Cheng Tsao
Ultra-Thinning of C4 Integrated Circuits for Backside Analysis during First Silicon Debug. Microelectron. Reliab. 41 (9-10) (2001)