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Ultra-Thinning of C4 Integrated Circuits for Backside Analysis during First Silicon Debug.
Ted R. Lundquist
E. Delenia
J. Harroun
E. LeRoy
Chun-Cheng Tsao
Published in:
Microelectron. Reliab. (2001)
Keyphrases
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integrated circuit
high speed
image analysis
statistical analysis
preprocessing
edge detection
mathematical analysis