Frank Altmann

Publication Activity (10 Years)

Years Active: 2006-2024
Publications (10 Years): 16

Top Topics

Qualitative Physics

Source Separation

High Resolution

Top Venues

Microelectron. Reliab.

Publications

Olena Yurchenko, Patrick Diehle, Frank Altmann, Katrin Schmitt, Jürgen Wöllenstein
Co3O4-Based Materials as Potential Catalysts for Methane Detection in Catalytic Gas Sensors. Sensors 24 (8) (2024)
Xhani Marvin Saß, Thilo Krachenfels, Frederik Dermot Pustelnik, Jean-Pierre Seifert, Christian Große, Frank Altmann
Modulation to the Rescue: Identifying Sub-Circuitry in the Transistor Morass for Targeted Analysis. CoRR (2023)
Xhani Marvin Saß, Thilo Krachenfels, Frederik Dermot Pustelnik, Jean-Pierre Seifert, Frank Altmann
Modulation to the Rescue: Identifying Sub-Circuitry in the Transistor Morass for Targeted Analysis. ASHES@CCS (2023)
Ilia Polian, Frank Altmann, Tolga Arul, Christian Boit, Ralf Brederlow, Lucas Davi, Rolf Drechsler, Nan Du, Thomas Eisenbarth, Tim Güneysu, Sascha Hermann, Matthias Hiller, Rainer Leupers, Farhad Merchant, Thomas Mussenbrock, Stefan Katzenbeisser, Akash Kumar, Wolfgang Kunz, Thomas Mikolajick, Vivek Pachauri, Jean-Pierre Seifert, Frank Sill Torres, Jens Trommer
Nano Security: From Nano-Electronics to Secure Systems. DATE (2021)
Michael Kögel, Sebastian Brand, Christian Große, Kristof J. P. Jacobs, Ingrid De Wolf, Frank Altmann
Thermal source separation for 3D defect localization using independent component analysis (ICA) from time-resolved temperature response (TRTR). CASE (2021)
Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Fabiana Rampazzo, Daniele Marcon, Veronica Gao Zhan, Francesca Chiocchetta, Andreas Graff, Frank Altmann, Michél Simon-Najasek, David Poppitz
Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling. IRPS (2020)
Norbert Herfurth, Anne Beyreuther, Elham Amini, Christian Boit, Michél Simon-Najasek, Susanne Hübner, Frank Altmann, R. Herfurth, Chen Wu, Ingrid De Wolf, Kris Croes
New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis. IRPS (2019)
Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann
Physical failure analysis methods for wide band gap semiconductor devices. IRPS (2018)
Andreas Graff, Michél Simon-Najasek, Frank Altmann, Ján Kuzmík, Dagmar Gregusová, S. Hascik, Helmut Jung, T. Baur, Jan Grünenpütt, Hervé Blanck
High resolution physical analysis of ohmic contact formation at GaN-HEMT devices. Microelectron. Reliab. (2017)
Florian Peter Pribahsnik, Michael Nelhiebel, M. Mataln, Mirko Bernardoni, G. Prechtl, Frank Altmann, David Poppitz, A. Lindemann
Exploring the thermal limit of GaN power devices under extreme overload conditions. Microelectron. Reliab. (2017)
Frank Altmann, Matthias Petzold
Innovative Failure Analysis Techniques for 3-D Packaging Developments. IEEE Des. Test 33 (3) (2016)
Falk Naumann, V. Gottschalk, B. Burchard, Frank Altmann
Reliability evaluation of Si-dies due to assembly issues. Microelectron. Reliab. 64 (2016)
Michél Simon-Najasek, G. Lorenz, A. Lindner, Frank Altmann
Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions. Microelectron. Reliab. 64 (2016)
Michael Kögel, Frank Altmann, S. Tismer, Sebastian Brand
Magnetic field and current density imaging using off-line lock-in analysis. Microelectron. Reliab. 64 (2016)
Mikael Broas, Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann, Helmut Jung, Hervé Blanck
Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures. Microelectron. Reliab. 64 (2016)
Sebastian Brand, Michél Simon-Najasek, Michael Kögel, Joerg Jatzkowski, R. Portius, Frank Altmann
Detection and analysis of stress-induced voiding in Al-power lines by acoustic GHz-microscopy. Microelectron. Reliab. 64 (2016)
Michél Simon-Najasek, Susanne Hübner, Frank Altmann, Andreas Graff
Advanced FIB sample preparation techniques for high resolution TEM investigations of HEMT structures. Microelectron. Reliab. 54 (9-10) (2014)
Joerg Jatzkowski, Michél Simon-Najasek, Frank Altmann
Novel techniques for dopant contrast analysis on real IC structures. Microelectron. Reliab. 52 (9-10) (2012)
Rudolf Schlangen, Hervé Deslandes, Ted R. Lundquist, C. Schmidt, Frank Altmann, K. Yu, A. Andreasyan, S. Li
Dynamic lock-in thermography for operation mode-dependent thermally active fault localization. Microelectron. Reliab. 50 (9-11) (2010)
O. Breitenstein, Frank Altmann, T. Riediger, D. Karg, V. Gottschalk
Lock-in thermal IR imaging using a solid immersion lens. Microelectron. Reliab. 46 (9-11) (2006)