Advanced FIB sample preparation techniques for high resolution TEM investigations of HEMT structures.
Michél Simon-NajasekSusanne HübnerFrank AltmannAndreas GraffPublished in: Microelectron. Reliab. (2014)
Keyphrases
- high resolution
- low resolution
- transmission electron microscopy
- field of view
- high quality
- learning algorithm
- data samples
- sample size
- high frequency
- real world
- super resolution
- satellite images
- test data
- high resolution color
- image super resolution
- magnetic resonance images
- remote sensing
- medical images
- computer vision
- artificial intelligence
- genetic algorithm
- machine learning