Michél Simon-Najasek

Publication Activity (10 Years)

Years Active: 2012-2021
Publications (10 Years): 10

Top Topics

Reliability Assessment

Field Effect Transistors

Structuring Elements

Top Venues

Microelectron. Reliab.

Publications

Maximilian Dammann, Martina Baeumler, Tobias Kemmer, Helmer Konstanzer, Peter Brückner, S. Krause, Andreas Graff, Michél Simon-Najasek
Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress. IRPS (2021)
Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Fabiana Rampazzo, Daniele Marcon, Veronica Gao Zhan, Francesca Chiocchetta, Andreas Graff, Frank Altmann, Michél Simon-Najasek, David Poppitz
Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling. IRPS (2020)
Norbert Herfurth, Anne Beyreuther, Elham Amini, Christian Boit, Michél Simon-Najasek, Susanne Hübner, Frank Altmann, R. Herfurth, Chen Wu, Ingrid De Wolf, Kris Croes
New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis. IRPS (2019)
Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann
Physical failure analysis methods for wide band gap semiconductor devices. IRPS (2018)
Maximilian Dammann, Martina Baeumler, Peter Brückner, Tobias Kemmer, Helmer Konstanzer, Andreas Graff, Michél Simon-Najasek, Rüdiger Quay
Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology. Microelectron. Reliab. (2018)
Maximilian Dammann, Martina Baeumler, Vladimir Polyakov, Peter Brückner, Helmer Konstanzer, Rüdiger Quay, Michael Mikulla, Andreas Graff, Michél Simon-Najasek
Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications. Microelectron. Reliab. (2017)
Andreas Graff, Michél Simon-Najasek, Frank Altmann, Ján Kuzmík, Dagmar Gregusová, S. Hascik, Helmut Jung, T. Baur, Jan Grünenpütt, Hervé Blanck
High resolution physical analysis of ohmic contact formation at GaN-HEMT devices. Microelectron. Reliab. (2017)
Michél Simon-Najasek, G. Lorenz, A. Lindner, Frank Altmann
Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions. Microelectron. Reliab. 64 (2016)
Mikael Broas, Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann, Helmut Jung, Hervé Blanck
Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures. Microelectron. Reliab. 64 (2016)
Sebastian Brand, Michél Simon-Najasek, Michael Kögel, Joerg Jatzkowski, R. Portius, Frank Altmann
Detection and analysis of stress-induced voiding in Al-power lines by acoustic GHz-microscopy. Microelectron. Reliab. 64 (2016)
Michél Simon-Najasek, Susanne Hübner, Frank Altmann, Andreas Graff
Advanced FIB sample preparation techniques for high resolution TEM investigations of HEMT structures. Microelectron. Reliab. 54 (9-10) (2014)
Joerg Jatzkowski, Michél Simon-Najasek, Frank Altmann
Novel techniques for dopant contrast analysis on real IC structures. Microelectron. Reliab. 52 (9-10) (2012)