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Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions.
Michél Simon-Najasek
G. Lorenz
A. Lindner
Frank Altmann
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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failure modes
low cost
mobile devices
high speed
real time
fuzzy logic
sensor data
mobile applications
circuit design
analog vlsi