Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling.
Enrico ZanoniMatteo MeneghiniGaudenzio MeneghessoFabiana RampazzoDaniele MarconVeronica Gao ZhanFrancesca ChiocchettaAndreas GraffFrank AltmannMichél Simon-NajasekDavid PoppitzPublished in: IRPS (2020)