Andreas Graff

Publication Activity (10 Years)

Years Active: 2014-2021
Publications (10 Years): 9

Top Topics

Electronic Devices

High Reliability

Structuring Elements

Top Venues

Microelectron. Reliab.

Publications

Maximilian Dammann, Martina Baeumler, Tobias Kemmer, Helmer Konstanzer, Peter Brückner, S. Krause, Andreas Graff, Michél Simon-Najasek
Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress. IRPS (2021)
Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Fabiana Rampazzo, Daniele Marcon, Veronica Gao Zhan, Francesca Chiocchetta, Andreas Graff, Frank Altmann, Michél Simon-Najasek, David Poppitz
Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling. IRPS (2020)
C. Monachon, M. S. Zielinski, J. Berney, D. Poppitz, Andreas Graff, S. Breuer, Lutz Kirste
Cathodoluminescence spectroscopy for failure analysis and process development of GaN-based microelectronic devices. IRPS (2018)
Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann
Physical failure analysis methods for wide band gap semiconductor devices. IRPS (2018)
Maximilian Dammann, Martina Baeumler, Peter Brückner, Tobias Kemmer, Helmer Konstanzer, Andreas Graff, Michél Simon-Najasek, Rüdiger Quay
Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology. Microelectron. Reliab. (2018)
Maximilian Dammann, Martina Baeumler, Vladimir Polyakov, Peter Brückner, Helmer Konstanzer, Rüdiger Quay, Michael Mikulla, Andreas Graff, Michél Simon-Najasek
Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications. Microelectron. Reliab. (2017)
Andreas Graff, Michél Simon-Najasek, Frank Altmann, Ján Kuzmík, Dagmar Gregusová, S. Hascik, Helmut Jung, T. Baur, Jan Grünenpütt, Hervé Blanck
High resolution physical analysis of ohmic contact formation at GaN-HEMT devices. Microelectron. Reliab. (2017)
Mikael Broas, Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann, Helmut Jung, Hervé Blanck
Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures. Microelectron. Reliab. 64 (2016)
Maximilian Dammann, Martina Baeumler, Peter Brückner, Wolfgang Bronner, Stephan Maroldt, Helmer Konstanzer, Matthias Wespel, Rüdiger Quay, Michael Mikulla, Andreas Graff, M. Lorenzini, M. Fagerlind, P. J. van der Wel, T. Rödle
Degradation of 0.25 μm GaN HEMTs under high temperature stress test. Microelectron. Reliab. 55 (9-10) (2015)
Benjamin März, Andreas Graff, Robert Klengel, Matthias Petzold
Interface microstructure effects in Au thermosonic ball bonding contacts by high reliability wire materials. Microelectron. Reliab. 54 (9-10) (2014)
Michél Simon-Najasek, Susanne Hübner, Frank Altmann, Andreas Graff
Advanced FIB sample preparation techniques for high resolution TEM investigations of HEMT structures. Microelectron. Reliab. 54 (9-10) (2014)