Vladimir Polyakov

Publication Activity (10 Years)

Years Active: 2011-2021
Publications (10 Years): 4

Top Topics

Language Processing

Silicon Dioxide

Semantic Relatedness Between Words

Top Venues

Microelectron. Reliab.

Publications

Vladimir Polyakov, Dmitriy Bukhanov, Maxim Panchenko
Identification of the Network State Based on the ART-2 Neural Network with a Hierarchical Memory Structure in Parallel Mode. RCAI (2021)
Tobias Kemmer, Michael Dammann, Martina Baeumler, Vladimir Polyakov, Peter Brückner, Helmer Konstanzer, Rüdiger Quay, Oliver Ambacher
Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under On- and Off-State Stress. IRPS (2020)
Maximilian Dammann, Martina Baeumler, Vladimir Polyakov, Peter Brückner, Helmer Konstanzer, Rüdiger Quay, Michael Mikulla, Andreas Graff, Michél Simon-Najasek
Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications. Microelectron. Reliab. (2017)
Ivan Anisimov, Elena Makarova, Vladimir Polyakov
Chunking in Dependency Model and Spelling Correction in Russian and English. IntelliSys (1) (2016)
Matthias Wespel, Maximilian Dammann, Vladimir Polyakov, Richard Reiner, Patrick Waltereit, B. Weiss, Rüdiger Quay, Michael Mikulla, Oliver Ambacher
High-voltage stress time-dependent dispersion effects in AlGaN/GaN HEMTs. IRPS (2015)
Matthias Wespel, Martina Baeumler, Vladimir Polyakov, Maximilian Dammann, Richard Reiner, Patrick Waltereit, Rüdiger Quay, Michael Mikulla, Oliver Ambacher
Influence of surface states on the voltage robustness of AlGaN/GaN HFET power devices. Microelectron. Reliab. 54 (12) (2014)
Valery D. Solovyev, Vladimir Polyakov, Vladimir Ivanov, Ivan Anisimov, Andrey Ponomarev
An Approach to Semantic Natural Language Processing of Russian Texts. Res. Comput. Sci. 65 (2013)
Anastasiia Kuzenkova, Anna Deripaska, Timofey Bryksin, Yurii Litvinov, Vladimir Polyakov
QReal DSM platform - An Environment for Creation of Specific Visual IDEs. ENASE (2013)
M. Cäsar, Maximilian Dammann, Vladimir Polyakov, Patrick Waltereit, Rüdiger Quay, Michael Mikulla, Oliver Ambacher
Critical factors influencing the voltage robustness of AlGaN/GaN HEMTs. Microelectron. Reliab. 51 (2) (2011)