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Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications.

Maximilian DammannMartina BaeumlerVladimir PolyakovPeter BrücknerHelmer KonstanzerRüdiger QuayMichael MikullaAndreas GraffMichél Simon-Najasek
Published in: Microelectron. Reliab. (2017)
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