RMS ERROR
Experts
- Norman L. Allinger
- Patrick Reynaert
- Ali M. Niknejad
- Jenn-Huei Lii
- J. Phillip Bowen
- P. R. Kumar
- Daniel Pivonka
- Maysam Ghovanloo
- Anatoly Yakovlev
- Piet Wambacq
- Gillat Kol
- Yunshan Zhang
- Andreas F. Molisch
- Adrian Tang
- Timothy G. Constandinou
- Yaoyao Jia
- Kuo-Hsiang Chen
- David T. Blaauw
- Yuxuan Luo
- Kofi A. A. Makinwa
- Zhuhao Li
- Jeongho Park
- Jianjun Yu
- Jörg Widmer
- Amir Shpilka
- Ada S. Y. Poon
- Amir Yehudayoff
- Young-Deuk Jeon
- Shay Moran
- Ziyi Chang
- Xavier Alameda-Pineda
- Xinying Li
- João P. Hespanha
- Amin Arbabian
- Jong-Kee Kwon
- Thomas H. Barratt
- Wen-Jun Lu
- Mitsuo Usami
- Massimo Pozzoni
Venues
- ISSCC
- J. Comput. Chem.
- CoRR
- IEEE J. Solid State Circuits
- OFC
- J. Chem. Inf. Model.
- ESSCIRC
- IEEE Access
- ISCAS
- ACM Multimedia
- CICC
- BioCAS
- A-SSCC
- Sensors
- IEEE Trans. Circuits Syst. I Regul. Pap.
- GLOBECOM
- IEEE Trans. Circuits Syst. II Express Briefs
- WSC
- IGARSS
- IEEE Internet Things J.
- IEEE Trans. Biomed. Circuits Syst.
- BCICTS
- VLSI Technology and Circuits
- DRC
- IEEE Trans. Instrum. Meas.
- ESSDERC
- J. Comput. Aided Mol. Des.
- MM&Sec
- ACSSC
- ICC
- IEEE Trans. Very Large Scale Integr. Syst.
- Microelectron. Reliab.
- ECOC
- NORCAS
- IEEE Trans. Ind. Electron.
- IEEE Wirel. Commun. Lett.
- PIMRC
- MWSCAS
- Environ. Model. Softw.
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