RMS ERROR
Experts
- Norman L. Allinger
- Patrick Reynaert
- Ali M. Niknejad
- P. R. Kumar
- Jenn-Huei Lii
- Daniel Pivonka
- J. Phillip Bowen
- Maysam Ghovanloo
- Anatoly Yakovlev
- Xinying Li
- Yaoyao Jia
- João P. Hespanha
- Jörg Widmer
- Jong-Kee Kwon
- Piet Wambacq
- Xavier Alameda-Pineda
- Kofi A. A. Makinwa
- Adrian Tang
- Amir Shpilka
- Young-Deuk Jeon
- Jeongho Park
- Zhuhao Li
- Yuxuan Luo
- Amir Yehudayoff
- Gillat Kol
- Ziyi Chang
- Yunshan Zhang
- David T. Blaauw
- Jianjun Yu
- Kuo-Hsiang Chen
- Timothy G. Constandinou
- Ada S. Y. Poon
- Andreas F. Molisch
- Amin Arbabian
- Shay Moran
- Hiroyuki Ozeki
- Xianbin Cao
- Makoto Suzuki
- Ljiljana Simic
Venues
- ISSCC
- J. Comput. Chem.
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- IEEE J. Solid State Circuits
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- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEEE Trans. Circuits Syst. II Express Briefs
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- IEEE Internet Things J.
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- VLSI Technology and Circuits
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- J. Comput. Aided Mol. Des.
- MM&Sec
- DRC
- IEEE Trans. Instrum. Meas.
- MWSCAS
- Microelectron. Reliab.
- NORCAS
- IEEE Trans. Ind. Electron.
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Wirel. Commun. Lett.
- ECOC
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- ISCAS (1)
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