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Tobias Kemmer
ORCID
Publication Activity (10 Years)
Years Active: 2018-2021
Publications (10 Years): 3
Top Topics
Nm Technology
Low Cost
Multiresolution
Reliability Analysis
Top Venues
IRPS
Microelectron. Reliab.
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Publications
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Maximilian Dammann
,
Martina Baeumler
,
Tobias Kemmer
,
Helmer Konstanzer
,
Peter Brückner
,
S. Krause
,
Andreas Graff
,
Michél Simon-Najasek
Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress.
IRPS
(2021)
Tobias Kemmer
,
Michael Dammann
,
Martina Baeumler
,
Vladimir Polyakov
,
Peter Brückner
,
Helmer Konstanzer
,
Rüdiger Quay
,
Oliver Ambacher
Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under On- and Off-State Stress.
IRPS
(2020)
Maximilian Dammann
,
Martina Baeumler
,
Peter Brückner
,
Tobias Kemmer
,
Helmer Konstanzer
,
Andreas Graff
,
Michél Simon-Najasek
,
Rüdiger Quay
Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology.
Microelectron. Reliab.
(2018)