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Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress.
Maximilian Dammann
Martina Baeumler
Tobias Kemmer
Helmer Konstanzer
Peter Brückner
S. Krause
Andreas Graff
Michél Simon-Najasek
Published in:
IRPS (2021)
Keyphrases
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statistical analysis
information retrieval
expert systems
database
databases
genetic algorithm
multiscale
video sequences
image analysis
active learning
wireless sensor networks
quantitative analysis
reliability analysis