T. Rödle

Publication Activity (10 Years)

Years Active: 2007-2015
Publications (10 Years): 0

Top Topics

High Temperature

Top Venues

Microelectron. Reliab.

Publications

Maximilian Dammann, Martina Baeumler, Peter Brückner, Wolfgang Bronner, Stephan Maroldt, Helmer Konstanzer, Matthias Wespel, Rüdiger Quay, Michael Mikulla, Andreas Graff, M. Lorenzini, M. Fagerlind, P. J. van der Wel, T. Rödle
Degradation of 0.25 μm GaN HEMTs under high temperature stress test. Microelectron. Reliab. 55 (9-10) (2015)
P. J. van der Wel, T. Rödle, Benoit Lambert, Hervé Blanck, Maximilian Dammann
Qualification of 50 V GaN on SiC technology for RF power amplifiers. Microelectron. Reliab. 53 (9-11) (2013)
Maximilian Dammann, W. Pletschen, Patrick Waltereit, Wolfgang Bronner, Rüdiger Quay, Stefan Müller, Michael Mikulla, Oliver Ambacher, P. J. van der Wel, S. Murad, T. Rödle, R. Behtash, F. Bourgeois, K. Riepe, Martin Fagerlind, Einar Örn Sveinbjörnsson
Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems. Microelectron. Reliab. 49 (5) (2009)
Theo Smedes, J. de Boet, T. Rödle
Selecting an appropriate ESD protection for discrete RF power LDMOSTs. Microelectron. Reliab. 47 (7) (2007)