Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems.
Maximilian DammannW. PletschenPatrick WaltereitWolfgang BronnerRüdiger QuayStefan MüllerMichael MikullaOliver AmbacherP. J. van der WelS. MuradT. RödleR. BehtashF. BourgeoisK. RiepeMartin FagerlindEinar Örn SveinbjörnssonPublished in: Microelectron. Reliab. (2009)
Keyphrases
- communication systems
- communication technologies
- information processing systems
- computer systems
- blind equalization
- wireless systems
- wireless channels
- multiple access
- underwater acoustic
- mobile devices
- mobile phone
- cognitive radio
- channel estimation
- mobile applications
- wireless access
- structuring elements
- mobile users
- mobile learning
- mobile computing
- metadata