High resolution physical analysis of ohmic contact formation at GaN-HEMT devices.

Andreas Graff Michél Simon-Najasek Frank Altmann Ján Kuzmík Dagmar Gregusová S. Hascik Helmut Jung T. Baur Jan Grünenpütt Hervé Blanck

Published in: Microelectron. Reliab. (2017)

Keyphrases