Christian Boit

Publication Activity (10 Years)

Years Active: 2001-2021
Publications (10 Years): 21

Top Topics

Fault Isolation

Reliability Assessment

Top Venues

Microelectron. Reliab.

IACR Cryptol. ePrint Arch.

Publications

Ilia Polian, Frank Altmann, Tolga Arul, Christian Boit, Ralf Brederlow, Lucas Davi, Rolf Drechsler, Nan Du, Thomas Eisenbarth, Tim Güneysu, Sascha Hermann, Matthias Hiller, Rainer Leupers, Farhad Merchant, Thomas Mussenbrock, Stefan Katzenbeisser, Akash Kumar, Wolfgang Kunz, Thomas Mikolajick, Vivek Pachauri, Jean-Pierre Seifert, Frank Sill Torres, Jens Trommer
Nano Security: From Nano-Electronics to Secure Systems. DATE (2021)
Elham Amini, Kai Bartels, Christian Boit, Marius Eggert, Norbert Herfurth, Tuba Kiyan, Thilo Krachenfels, Jean-Pierre Seifert, Shahin Tajik
Special Session: Physical Attacks through the Chip Backside: Threats, Challenges, and Opportunities. VTS (2021)
Norbert Herfurth, Anne Beyreuther, Elham Amini, Christian Boit, Michél Simon-Najasek, Susanne Hübner, Frank Altmann, R. Herfurth, Chen Wu, Ingrid De Wolf, Kris Croes
New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis. IRPS (2019)
Ivo Vogt, Tomonori Nakamura, Ingrid De Wolf, Christian Boit
Detection of failure mechanisms in 24-40 nm FinFETs with (spectral) photon emission techniques using InGaAs camera. Microelectron. Reliab. (2018)
Elham Amini, Anne Beyreuther, Norbert Herfurth, Alexander Steigert, R. Muydinov, Bernd Szyszka, Christian Boit
IC security and quality improvement by protection of chip backside against hardware attacks. Microelectron. Reliab. (2018)
Heiko Lohrke, Shahin Tajik, Thilo Krachenfels, Christian Boit, Jean-Pierre Seifert
Key Extraction using Thermal Laser Stimulation: A Case Study on Xilinx Ultrascale FPGAs. IACR Cryptol. ePrint Arch. 2018 (2018)
Elham Amini, Anne Beyreuther, Norbert Herfurth, Alexander Steigert, Bernd Szyszka, Christian Boit
Assessment of a Chip Backside Protection. J. Hardw. Syst. Secur. 2 (4) (2018)
Ivo Vogt, Tomonori Nakamura, B. Motamedi, Christian Boit
Device characterization of 16/14 nm FinFETs for reliability assessment with infrared emission spectra. Microelectron. Reliab. (2018)
Anne Beyreuther, Norbert Herfurth, Elham Amini, Tomonori Nakamura, Ingrid De Wolf, Christian Boit
Photon emission as a characterization tool for bipolar parasitics in FinFET technology. Microelectron. Reliab. (2018)
Heiko Lohrke, Shahin Tajik, Thilo Krachenfels, Christian Boit, Jean-Pierre Seifert
Key Extraction Using Thermal Laser Stimulation A Case Study on Xilinx Ultrascale FPGAs. IACR Trans. Cryptogr. Hardw. Embed. Syst. 2018 (3) (2018)
Shahin Tajik, Heiko Lohrke, Jean-Pierre Seifert, Christian Boit
On the Power of Optical Contactless Probing: Attacking Bitstream Encryption of FPGAs. CCS (2017)
Shahin Tajik, Enrico Dietz, Sven Frohmann, Helmar Dittrich, Dmitry Nedospasov, Clemens Helfmeier, Jean-Pierre Seifert, Christian Boit, Heinz-Wilhelm Hübers
Photonic Side-Channel Analysis of Arbiter PUFs. J. Cryptol. 30 (2) (2017)
Christian Boit
Technologies for Heterogeneous Integration - Challenges and chances for fault isolation. Microelectron. Reliab. (2017)
Shahin Tajik, Heiko Lohrke, Jean-Pierre Seifert, Christian Boit
On the Power of Optical Contactless Probing: Attacking Bitstream Encryption of FPGAs. IACR Cryptol. ePrint Arch. 2017 (2017)
Ivo Vogt, Tomonori Nakamura, Christian Boit
Optical interaction in active analog circuit elements. Microelectron. Reliab. (2017)
Shahin Tajik, Julian Fietkau, Heiko Lohrke, Jean-Pierre Seifert, Christian Boit
PUFMon: Security monitoring of FPGAs using physically unclonable functions. IOLTS (2017)
Heiko Lohrke, Shahin Tajik, Christian Boit, Jean-Pierre Seifert
No Place to Hide: Contactless Probing of Secret Data on FPGAs. CHES (2016)
Heiko Lohrke, Shahin Tajik, Christian Boit, Jean-Pierre Seifert
No Place to Hide: Contactless Probing of Secret Data on FPGAs. IACR Cryptol. ePrint Arch. 2016 (2016)
Shahin Tajik, Heiko Lohrke, Fatemeh Ganji, Jean-Pierre Seifert, Christian Boit
Laser Fault Attack on Physically Unclonable Functions. FDTC (2015)
Shahin Tajik, Enrico Dietz, Sven Frohmann, Helmar Dittrich, Dmitry Nedospasov, Clemens Helfmeier, Jean-Pierre Seifert, Christian Boit, Heinz-Wilhelm Hübers
A Complete and Linear Physical Characterization Methodology for the Arbiter PUF Family. IACR Cryptol. ePrint Arch. 2015 (2015)
Clemens Helfmeier, Anne Beyreuther, Alexander Fox, Christian Boit
Ultra sensitive measurement of dielectric current under pulsed stress conditions. Microelectron. Reliab. 55 (11) (2015)
Clemens Helfmeier, Rudolf Schlangen, Christian Boit
Focused ion beam contact to non-volatile memory cells. Microelectron. Reliab. 54 (9-10) (2014)
Christian Boit
Editorial. Microelectron. Reliab. 54 (9-10) (2014)
Shahin Tajik, Dmitry Nedospasov, Clemens Helfmeier, Jean-Pierre Seifert, Christian Boit
Emission Analysis of Hardware Implementations. DSD (2014)
Arkadiusz Glowacki, Christian Boit, Philippe Perdu, Yoshitaka Iwaki
Backside spectroscopic photon emission microscopy using intensified silicon CCD. Microelectron. Reliab. 54 (9-10) (2014)
Shahin Tajik, Enrico Dietz, Sven Frohmann, Jean-Pierre Seifert, Dmitry Nedospasov, Clemens Helfmeier, Christian Boit, Helmar Dittrich
Physical Characterization of Arbiter PUFs. IACR Cryptol. ePrint Arch. 2014 (2014)
Ponky Ivo, Eunjung Melanie Cho, Przemyslaw Kotara, Lars Schellhase, Richard Lossy, Ute Zeimer, Anna Mogilatenko, Joachim Würfl, Günther Tränkle, Arkadiusz Glowacki, Christian Boit
New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100 nm scale unpassivated regions around the gate periphery. Microelectron. Reliab. 54 (6-7) (2014)
Clemens Helfmeier, Christian Boit, Dmitry Nedospasov, Shahin Tajik, Jean-Pierre Seifert
Physical vulnerabilities of Physically Unclonable Functions. DATE (2014)
Philipp Scholz, Norbert Herfurth, Michael Sadowski, Ted R. Lundquist, Uwe Kerst, Christian Boit
Efficient and flexible Focused Ion Beam micromachining of Solid Immersion Lenses in various bulk semiconductor materials - An adaptive calibration algorithm. Microelectron. Reliab. 54 (9-10) (2014)
Shahin Tajik, Enrico Dietz, Sven Frohmann, Jean-Pierre Seifert, Dmitry Nedospasov, Clemens Helfmeier, Christian Boit, Helmar Dittrich
Physical Characterization of Arbiter PUFs. CHES (2014)
Clemens Helfmeier, Dmitry Nedospasov, Christopher Tarnovsky, Jan Starbug Krissler, Christian Boit, Jean-Pierre Seifert
Breaking and entering through the silicon. CCS (2013)
Dmitry Nedospasov, Jean-Pierre Seifert, Clemens Helfmeier, Christian Boit
Invasive PUF Analysis. FDTC (2013)
Clemens Helfmeier, Christian Boit, Dmitry Nedospasov, Jean-Pierre Seifert
Cloning Physically Unclonable Functions. HOST (2013)
Christian Boit, Clemens Helfmeier, Dmitry Nedospasov
Feasibly clonable functions. TrustED@CCS (2013)
Christian Boit, Clemens Helfmeier, Uwe Kerst
Security Risks Posed by Modern IC Debug and Diagnosis Tools. FDTC (2013)
Clemens Helfmeier, Christian Boit, Uwe Kerst
On charge sensors for FIB attack detection. HOST (2012)
Arkadiusz Glowacki, Christian Boit, Philippe Perdu
Optimum Si thickness for backside detection of photon emission using Si-CCD. Microelectron. Reliab. 52 (9-10) (2012)
Carlo Pagano, Christian Boit, Arkadiusz Glowacki, Reiner Leihkauf, Yoshiyuki Yokoyama
Comparison of FET electro-optical modulation for 1300 nm and 1064 nm laser sources. Microelectron. Reliab. 52 (9-10) (2012)
Arkadiusz Glowacki, Christian Boit, Philippe Perdu
Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning. Microelectron. Reliab. 51 (9-11) (2011)
Ponky Ivo, Arkadiusz Glowacki, Eldad Bahat-Treidel, Richard Lossy, Joachim Würfl, Christian Boit, Günther Tränkle
Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements. Microelectron. Reliab. 51 (2) (2011)
Sanjib Kumar Brahma, Arkadiusz Glowacki, Reiner Leihkauf, Christian Boit
Laser induced impact ionization effect in MOSFET during 1064 nm laser stimulation. Microelectron. Reliab. 51 (9-11) (2011)
Mahyar Boostandoost, Uwe Kerst, Christian Boit
Extraction of local thin-film solar cell parameters by bias-dependent IR-LBIC. Microelectron. Reliab. 50 (9-11) (2010)
Philipp Scholz, Christian Gallrapp, Uwe Kerst, Ted R. Lundquist, Christian Boit
Optimizing focused ion beam created solid immersion lenses in bulk silicon using design of experiments. Microelectron. Reliab. 50 (9-11) (2010)
Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Ted R. Lundquist, Peter Egger, Christian Boit
Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing. Microelectron. Reliab. 49 (9-11) (2009)
Arkadiusz Glowacki, Piotr Laskowski, Christian Boit, Ponky Ivo, Eldad Bahat-Treidel, Reza Pazirandeh, Richard Lossy, Joachim Würfl, Günther Tränkle
Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures. Microelectron. Reliab. 49 (9-11) (2009)
Ulrike Kindereit, Christian Boit, Uwe Kerst, Steven Kasapi, Radu Ispasoiu, Roy Ng, William K. Lo
Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology. Microelectron. Reliab. 48 (8-9) (2008)
Piotr Laskowski, Arkadiusz Glowacki, Christian Boit
Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits. Microelectron. Reliab. 48 (8-9) (2008)
Tuba Kiyan, Christof Brillert, Christian Boit
Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in externally triggered pulsing condition. Microelectron. Reliab. 48 (8-9) (2008)
Christian Boit, Rudolf Schlangen, Uwe Kerst, Ted R. Lundquist
Physical Techniques for Chip-Backside IC Debug in Nanotechnologies. IEEE Des. Test Comput. 25 (3) (2008)
Rudolf Schlangen, Uwe Kerst, Christian Boit, Tahir Malik, Rajesh Jain, Ted R. Lundquist
Non destructive 3D chip inspection with nano scale potential by use of backside FIB and backscattered electron microscopy. Microelectron. Reliab. 47 (9-11) (2007)
Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Christian Boit, Rajesh Jain, Tahir Malik, Keneth R. Wilsher, Ted R. Lundquist, Bernd Krüger
Backside E-Beam Probing on Nano scale devices. ITC (2007)
Rudolf Schlangen, Peter Sadewater, Uwe Kerst, Christian Boit
Contact to contacts or silicide by use of backside FIB circuit edit allowing to approach every active circuit node. Microelectron. Reliab. 46 (9-11) (2006)
Rudolf Schlangen, Uwe Kerst, A. Kabakow, Christian Boit
Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations. Microelectron. Reliab. 45 (9-11) (2005)
Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki
Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout. Microelectron. Reliab. 45 (9-11) (2005)
Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki, Hiroyoshi Suzuki
Localization of FET Device Performance with Thermal Laser Stimulation. Microelectron. Reliab. 44 (9-11) (2004)
Bernd Ebersberger, Alexander Olbrich, Christian Boit
Application of Scanning Probe Microscopy techniques in Semiconductor Failure Analysis. Microelectron. Reliab. 41 (9-10) (2001)
Bernd Ebersberger, Alexander Olbrich, Christian Boit
Scanning probe microscopy in semiconductor failure analysis. Microelectron. Reliab. 41 (8) (2001)