Device characterization of 16/14 nm FinFETs for reliability assessment with infrared emission spectra.
Ivo VogtTomonori NakamuraB. MotamediChristian BoitPublished in: Microelectron. Reliab. (2018)
Keyphrases
- infrared
- reliability assessment
- short wave
- hyperspectral
- infrared images
- multi sensor
- hyperspectral data
- gaze tracking
- power system
- visible spectrum
- infrared imagery
- target detection
- hyperspectral images
- metal oxide semiconductor
- electro optical
- multiscale
- target detection and tracking
- principal component analysis
- night vision
- spectral data
- thermal infrared
- real time
- machine vision
- infrared video
- image formation