Ivo Vogt

Publication Activity (10 Years)

Years Active: 2017-2018
Publications (10 Years): 3

Top Topics

Reliability Assessment

Metal Oxide Semiconductor

Thermal Infrared

Top Venues

Microelectron. Reliab.

Publications

Ivo Vogt, Tomonori Nakamura, Ingrid De Wolf, Christian Boit
Detection of failure mechanisms in 24-40 nm FinFETs with (spectral) photon emission techniques using InGaAs camera. Microelectron. Reliab. (2018)
Ivo Vogt, Tomonori Nakamura, B. Motamedi, Christian Boit
Device characterization of 16/14 nm FinFETs for reliability assessment with infrared emission spectra. Microelectron. Reliab. (2018)
Ivo Vogt, Tomonori Nakamura, Christian Boit
Optical interaction in active analog circuit elements. Microelectron. Reliab. (2017)