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Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology.

Ulrike KindereitChristian BoitUwe KerstSteven KasapiRadu IspasoiuRoy NgWilliam K. Lo
Published in: Microelectron. Reliab. (2008)
Keyphrases
  • nm technology
  • power consumption
  • low power
  • mobile devices
  • embedded systems
  • power dissipation
  • high voltage
  • case study
  • metal oxide