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Peter Egger
ORCID
Publication Activity (10 Years)
Years Active: 1989-2022
Publications (10 Years): 5
Top Topics
Scientific Documents
Autoregressive Moving Average
Software Product
Reverse Engineer
Top Venues
CoRR
SDU@AAAI
ASP-DAC
J. Geogr. Syst.
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Publications
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Susie Xi Rao
,
Piriyakorn Piriyatamwong
,
Parijat Ghoshal
,
Sara Nasirian
,
Emmanuel de Salis
,
Sandra Mitrovic
,
Michael Wechner
,
Vanya Brucker
,
Peter Egger
,
Ce Zhang
Keyword Extraction in Scientific Documents.
CoRR
(2022)
Susie Xi Rao
,
Johannes Rausch
,
Peter Egger
,
Ce Zhang
TableParser: Automatic Table Parsing with Weak Supervision from Spreadsheets.
SDU@AAAI
(2022)
Susie Xi Rao
,
Johannes Rausch
,
Peter Egger
,
Ce Zhang
TableParser: Automatic Table Parsing with Weak Supervision from Spreadsheets.
CoRR
(2022)
Bernhard Lippmann
,
Niklas Unverricht
,
Aayush Singla
,
Matthias Ludwig
,
Michael Werner
,
Peter Egger
,
Anja Dübotzky
,
Helmut Gräb
,
Horst A. Gieser
,
Martin Rasche
,
Oliver Kellermann
Verification of physical designs using an integrated reverse engineering flow for nanoscale technologies.
Integr.
71 (2020)
Bernhard Lippmann
,
Michael Werner
,
Niklas Unverricht
,
Aayush Singla
,
Peter Egger
,
Anja Dübotzky
,
Horst A. Gieser
,
Martin Rasche
,
Oliver Kellermann
,
Helmut Graeb
Integrated flow for reverse engineering of nanoscale technologies.
ASP-DAC
(2019)
Harald Badinger
,
Peter Egger
Estimation and testing of higher-order spatial autoregressive panel data error component models.
J. Geogr. Syst.
15 (4) (2013)
Rudolf Schlangen
,
Reiner Leihkauf
,
Uwe Kerst
,
Ted R. Lundquist
,
Peter Egger
,
Christian Boit
Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing.
Microelectron. Reliab.
49 (9-11) (2009)
Stefan Müller
,
Peter Egger
Investigation of low temperature SRAM and ROM failures to enable the replacement of cold test insertion by room temperature test.
Microelectron. Reliab.
47 (9-11) (2007)
Peter Egger
,
Markus Grützner
,
Christian Burmer
,
Fabien Dudkiewicz
Application of time resolved emission techniques within the failure analysis flow.
Microelectron. Reliab.
47 (9-11) (2007)
Peter Egger
Alternativen für den Einsatz der EDV in der Ausbildung von Industriekaufleuten bei VW.
INFOS
(1989)