Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations.
Rudolf SchlangenUwe KerstA. KabakowChristian BoitPublished in: Microelectron. Reliab. (2005)
Keyphrases
- chip design
- analog vlsi
- high speed
- low voltage
- cmos technology
- circuit design
- random access memory
- power dissipation
- electronic circuits
- built in self test
- mixed signal
- low power
- question answering
- printed circuit boards
- power consumption
- natural language processing
- focal plane
- design methodology
- physical design
- power grid
- wall street journal
- low cost
- high density
- delay insensitive
- information extraction
- transmission line
- logic circuits
- digital circuits
- logic synthesis
- single chip
- physical characteristics
- electrical properties
- programmable logic
- electro mechanical