Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures.
Arkadiusz GlowackiPiotr LaskowskiChristian BoitPonky IvoEldad Bahat-TreidelReza PazirandehRichard LossyJoachim WürflGünther TränklePublished in: Microelectron. Reliab. (2009)