Arkadiusz Glowacki

Publication Activity (10 Years)

Years Active: 2004-2014
Publications (10 Years): 0

Top Topics

Invariant Descriptors

Top Venues

Microelectron. Reliab.

Publications

Arkadiusz Glowacki, Christian Boit, Philippe Perdu, Yoshitaka Iwaki
Backside spectroscopic photon emission microscopy using intensified silicon CCD. Microelectron. Reliab. 54 (9-10) (2014)
Ponky Ivo, Eunjung Melanie Cho, Przemyslaw Kotara, Lars Schellhase, Richard Lossy, Ute Zeimer, Anna Mogilatenko, Joachim Würfl, Günther Tränkle, Arkadiusz Glowacki, Christian Boit
New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100 nm scale unpassivated regions around the gate periphery. Microelectron. Reliab. 54 (6-7) (2014)
Arkadiusz Glowacki, Christian Boit, Philippe Perdu
Optimum Si thickness for backside detection of photon emission using Si-CCD. Microelectron. Reliab. 52 (9-10) (2012)
Carlo Pagano, Christian Boit, Arkadiusz Glowacki, Reiner Leihkauf, Yoshiyuki Yokoyama
Comparison of FET electro-optical modulation for 1300 nm and 1064 nm laser sources. Microelectron. Reliab. 52 (9-10) (2012)
Arkadiusz Glowacki, Christian Boit, Philippe Perdu
Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning. Microelectron. Reliab. 51 (9-11) (2011)
Ponky Ivo, Arkadiusz Glowacki, Eldad Bahat-Treidel, Richard Lossy, Joachim Würfl, Christian Boit, Günther Tränkle
Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements. Microelectron. Reliab. 51 (2) (2011)
Sanjib Kumar Brahma, Arkadiusz Glowacki, Reiner Leihkauf, Christian Boit
Laser induced impact ionization effect in MOSFET during 1064 nm laser stimulation. Microelectron. Reliab. 51 (9-11) (2011)
Arkadiusz Glowacki, Piotr Laskowski, Christian Boit, Ponky Ivo, Eldad Bahat-Treidel, Reza Pazirandeh, Richard Lossy, Joachim Würfl, Günther Tränkle
Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures. Microelectron. Reliab. 49 (9-11) (2009)
Piotr Laskowski, Arkadiusz Glowacki, Christian Boit
Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits. Microelectron. Reliab. 48 (8-9) (2008)
Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki
Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout. Microelectron. Reliab. 45 (9-11) (2005)
Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki, Hiroyoshi Suzuki
Localization of FET Device Performance with Thermal Laser Stimulation. Microelectron. Reliab. 44 (9-11) (2004)