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Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements.

Ponky IvoArkadiusz GlowackiEldad Bahat-TreidelRichard LossyJoachim WürflChristian BoitGünther Tränkle
Published in: Microelectron. Reliab. (2011)
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