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Breaking and entering through the silicon.

Clemens HelfmeierDmitry NedospasovChristopher TarnovskyJan Starbug KrisslerChristian BoitJean-Pierre Seifert
Published in: CCS (2013)
Keyphrases
  • face recognition
  • high speed
  • low cost
  • high density
  • image segmentation
  • database
  • silicon dioxide
  • gallium arsenide
  • neural network
  • high level
  • plasma etching