Focused ion beam contact to non-volatile memory cells.
Clemens HelfmeierRudolf SchlangenChristian BoitPublished in: Microelectron. Reliab. (2014)
Keyphrases
- main memory
- data storage
- flash memory
- memory requirements
- memory usage
- memory size
- data structure
- memory space
- image segmentation
- multi dimensional
- real time
- electron beam
- cellular automaton
- computational power
- low memory
- memory capacity
- stem cell
- densely packed
- cross section
- random access
- database management systems
- image sequences
- case study
- artificial intelligence
- machine learning
- data sets