Michael Nelhiebel

Publication Activity (10 Years)

Years Active: 2005-2023
Publications (10 Years): 6

Top Topics

Electrical Energy

Chemical Vapor Deposition

Semiconductor Devices

Top Venues

Microelectron. Reliab.

Publications

D. Wieland, S. Ofner, M. Stabentheiner, B. Butej, Christian Koller, J. Sun, Andrea Minetto, K. Reiser, Oliver Häberlen, Michael Nelhiebel, Michael Glavanovics, Dionyz Pogany, Clemens Ostermaier
A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests. IRPS (2023)
T. Walter, Golta Khatibi, Michael Nelhiebel, M. Stefenelli
Characterization of cyclic delamination behavior of thin film multilayers. Microelectron. Reliab. (2018)
Florian Peter Pribahsnik, Mirko Bernardoni, Michael Nelhiebel, M. Mataln, A. Lindemann
Combined experimental and numerical approach to study electro-mechanical resonant phenomena in GaN-on-Si heterostructures. Microelectron. Reliab. (2018)
Alice Lassnig, M. Lederer, Golta Khatibi, Rainer Pelzer, W. Robl, Michael Nelhiebel
High cycle fatigue testing of thermosonic ball bonds. Microelectron. Reliab. 71 (2017)
Florian Peter Pribahsnik, Michael Nelhiebel, M. Mataln, Mirko Bernardoni, G. Prechtl, Frank Altmann, David Poppitz, A. Lindemann
Exploring the thermal limit of GaN power devices under extreme overload conditions. Microelectron. Reliab. (2017)
Florian W. Dietachmayr, Patrick A. Hölzl, Bernhard G. Zagar, Michael Nelhiebel
Inspection of electrical interconnections within power ICs via magneto-optical imaging. I2MTC (2015)
Olivia Bluder, Kathrin Plankensteiner, Michael Nelhiebel, Walther Heinz, Christian Leitner
Modeling fatigue life of power semiconductor devices with ε-N fields. WSC (2014)
Michael Nelhiebel, Robert Illing, Thomas Detzel, S. Wöhlert, B. Auer, S. Lanzerstorfer, M. Rogalli, W. Robl, Stefan Decker, J. Fugger, Markus Ladurner
Effective and reliable heat management for power devices exposed to cyclic short overload pulses. Microelectron. Reliab. 53 (9-11) (2013)
Thomas Aichinger, Michael Nelhiebel, Tibor Grasser
Refined NBTI characterization of arbitrarily stressed PMOS devices at ultra-low and unique temperatures. Microelectron. Reliab. 53 (7) (2013)
Stefano de Filippis, Helmut Köck, Michael Nelhiebel, Vladimír Kosel, Stefan Decker, Michael Glavanovics, Andrea Irace
Modeling of highly anisotropic microstructures for electro-thermal simulations of power semiconductor devices. Microelectron. Reliab. 52 (9-10) (2012)
Rainer Pelzer, Michael Nelhiebel, Robert Zink, Stefan Wöhlert, Alice Lassnig, Golta Khatibi
High temperature storage reliability investigation of the Al-Cu wire bond interface. Microelectron. Reliab. 52 (9-10) (2012)
Helmut Köck, Christian Djelassi, Stefano de Filippis, Robert Illing, Michael Nelhiebel, Markus Ladurner, Michael Glavanovics, Dionyz Pogany
Improved thermal management of low voltage power devices with optimized bond wire positions. Microelectron. Reliab. 51 (9-11) (2011)
Gregor Pobegen, Thomas Aichinger, Tibor Grasser, Michael Nelhiebel
Impact of gate poly doping and oxide thickness on the N- and PBTI in MOSFETs. Microelectron. Reliab. 51 (9-11) (2011)
Michael Nelhiebel, Robert Illing, C. Schreiber, S. Wöhlert, S. Lanzerstorfer, Markus Ladurner, C. Kadow, Stefan Decker, Donald Dibra, H. Unterwalcher, M. Rogalli, W. Robl, T. Herzig, M. Poschgan, M. Inselsbacher, Michael Glavanovics, Sylvain Fraïssé
A reliable technology concept for active power cycling to extreme temperatures. Microelectron. Reliab. 51 (9-11) (2011)
Thomas Aichinger, Michael Nelhiebel, Tibor Grasser
On the temperature dependence of NBTI recovery. Microelectron. Reliab. 48 (8-9) (2008)
Michael Nelhiebel, J. Wissenwasser, Thomas Detzel, A. Timmerer, E. Bertagnolli
Hydrogen-related influence of the metallization stack on characteristics and reliability of a trench gate oxide. Microelectron. Reliab. 45 (9-11) (2005)