Login / Signup

A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests.

D. WielandS. OfnerM. StabentheinerB. ButejChristian KollerJ. SunAndrea MinettoK. ReiserOliver HäberlenMichael NelhiebelMichael GlavanovicsDionyz PoganyClemens Ostermaier
Published in: IRPS (2023)
Keyphrases
  • short circuit
  • computer vision
  • real time
  • genetic algorithm
  • decision making
  • wireless sensor networks