A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests.
D. WielandS. OfnerM. StabentheinerB. ButejChristian KollerJ. SunAndrea MinettoK. ReiserOliver HäberlenMichael NelhiebelMichael GlavanovicsDionyz PoganyClemens OstermaierPublished in: IRPS (2023)