Clemens Ostermaier

Publication Activity (10 Years)

Years Active: 2012-2023
Publications (10 Years): 2

Top Topics

Chemical Vapor Deposition

Structuring Elements

Electrical Properties

Top Venues

Microelectron. Reliab.

Publications

D. Wieland, S. Ofner, M. Stabentheiner, B. Butej, Christian Koller, J. Sun, Andrea Minetto, K. Reiser, Oliver Häberlen, Michael Nelhiebel, Michael Glavanovics, Dionyz Pogany, Clemens Ostermaier
A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests. IRPS (2023)
Clemens Ostermaier, Peter Lagger, M. Reiner, Dionyz Pogany
Review of bias-temperature instabilities at the III-N/dielectric interface. Microelectron. Reliab. 82 (2018)
Roberta Stradiotto, Gregor Pobegen, Clemens Ostermaier, Tibor Grasser
On the fly characterization of charge trapping phenomena at GaN/dielectric and GaN/AlGaN/dielectric interfaces using impedance measurements. ESSDERC (2015)
Peter Lagger, S. Donsa, P. Spreitzer, Gregor Pobegen, M. Reiner, H. Naharashi, J. Mohamed, H. Mosslacher, G. Prechtl, Dionyz Pogany, Clemens Ostermaier
Thermal activation of PBTI-related stress and recovery processes in GaN MIS-HEMTs using on-wafer heaters. IRPS (2015)
Clemens Ostermaier, Peter Lagger, Mohammed Alomari, Patrick Herfurth, David Maier, Alexander Alexewicz, Marie-Antoinette di Forte-Poisson, Sylvain L. Delage, Gottfried Strasser, Dionyz Pogany, Erhard Kohn
Reliability investigation of the degradation of the surface passivation of InAlN/GaN HEMTs using a dual gate structure. Microelectron. Reliab. 52 (9-10) (2012)