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On the fly characterization of charge trapping phenomena at GaN/dielectric and GaN/AlGaN/dielectric interfaces using impedance measurements.

Roberta StradiottoGregor PobegenClemens OstermaierTibor Grasser
Published in: ESSDERC (2015)
Keyphrases
  • transmission line
  • structuring elements
  • electrical properties
  • data sets
  • silicon dioxide
  • chemical vapor deposition
  • neural network
  • user interface
  • gray scale
  • high density
  • measurement noise