Login / Signup
On the fly characterization of charge trapping phenomena at GaN/dielectric and GaN/AlGaN/dielectric interfaces using impedance measurements.
Roberta Stradiotto
Gregor Pobegen
Clemens Ostermaier
Tibor Grasser
Published in:
ESSDERC (2015)
Keyphrases
</>
transmission line
structuring elements
electrical properties
data sets
silicon dioxide
chemical vapor deposition
neural network
user interface
gray scale
high density
measurement noise