Thermal activation of PBTI-related stress and recovery processes in GaN MIS-HEMTs using on-wafer heaters.

Peter Lagger S. Donsa P. Spreitzer Gregor Pobegen M. Reiner H. Naharashi J. Mohamed H. Mosslacher G. Prechtl Dionyz Pogany Clemens Ostermaier

Published in: IRPS (2015)

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