Michael Glavanovics

Publication Activity (10 Years)

Years Active: 2004-2023
Publications (10 Years): 2

Top Topics

Agent Based Architecture

Distributed Multimedia

Top Venues

Publications

D. Wieland, S. Ofner, M. Stabentheiner, B. Butej, Christian Koller, J. Sun, Andrea Minetto, K. Reiser, Oliver Häberlen, Michael Nelhiebel, Michael Glavanovics, Dionyz Pogany, Clemens Ostermaier
A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests. IRPS (2023)
Benjamin Steinwender, Michael Glavanovics, Wilfried Elmenreich
Executable test definition for a state machine driven embedded test controller module. INDIN (2015)
Benjamin Steinwender, Sascha Einspieler, Michael Glavanovics, Wilfried Elmenreich
Distributed power semiconductor stress test & measurement architecture. INDIN (2013)
Stefano de Filippis, Helmut Köck, Michael Nelhiebel, Vladimír Kosel, Stefan Decker, Michael Glavanovics, Andrea Irace
Modeling of highly anisotropic microstructures for electro-thermal simulations of power semiconductor devices. Microelectron. Reliab. 52 (9-10) (2012)
Helmut Köck, Christian Djelassi, Stefano de Filippis, Robert Illing, Michael Nelhiebel, Markus Ladurner, Michael Glavanovics, Dionyz Pogany
Improved thermal management of low voltage power devices with optimized bond wire positions. Microelectron. Reliab. 51 (9-11) (2011)
Olivia Bluder, Michael Glavanovics, Jürgen Pilz
Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability. Microelectron. Reliab. 51 (9-11) (2011)
Michael Nelhiebel, Robert Illing, C. Schreiber, S. Wöhlert, S. Lanzerstorfer, Markus Ladurner, C. Kadow, Stefan Decker, Donald Dibra, H. Unterwalcher, M. Rogalli, W. Robl, T. Herzig, M. Poschgan, M. Inselsbacher, Michael Glavanovics, Sylvain Fraïssé
A reliable technology concept for active power cycling to extreme temperatures. Microelectron. Reliab. 51 (9-11) (2011)
Vladimír Kosel, Robert Illing, Michael Glavanovics, Alexander Satka
Non-linear thermal modeling of DMOS transistor and validation using electrical measurements and FEM simulations. Microelectron. J. 41 (12) (2010)
Helmut Köck, Vladimír Kosel, Christian Djelassi, Michael Glavanovics, Dionyz Pogany
IR thermography and FEM simulation analysis of on-chip temperature during thermal-cycling power-metal reliability testing using in situ heated structures. Microelectron. Reliab. 49 (9-11) (2009)
Hans-Peter Kreuter, Vladimír Kosel, Michael Glavanovics, Robert Illing
System level modeling of smart power switches using SystemC-AMS for digital protection concept verification. BMAS (2009)
Michael Glavanovics, Helmut Köck, Vladimír Kosel, Tobias Smorodin
Flexible active cycle stress testing of smart power switches. Microelectron. Reliab. 47 (9-11) (2007)
Thomas Detzel, Michael Glavanovics, Karin Weber
Analysis of wire bond and metallization degradation mechanisms in DMOS power transistors stressed under thermal overload conditions. Microelectron. Reliab. 44 (9-11) (2004)