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Olivia Bluder
ORCID
Publication Activity (10 Years)
Years Active: 2011-2018
Publications (10 Years): 3
Top Topics
Test Data
Semiconductor Devices
Markov Random Field
Pattern Extraction
Top Venues
WSC
IPTA
ICMLA
ICIAR
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Publications
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Stefan Schrunner
,
Olivia Bluder
,
Anja Zernig
,
Andre Kästner
,
Roman Kern
A Comparison of Supervised Approaches for Process Pattern Recognition in Analog Semiconductor Wafer Test Data.
ICMLA
(2018)
Dzenana Alagic
,
Olivia Bluder
,
Jürgen Pilz
Quantification and Prediction of Damage in SAM Images of Semiconductor Devices.
ICIAR
(2018)
Stefan Schrunner
,
Olivia Bluder
,
Anja Zernig
,
Andre Kästner
,
Roman Kern
Markov random fields for pattern extraction in analog wafer test data.
IPTA
(2017)
Kathrin Plankensteiner
,
Olivia Bluder
,
Jürgen Pilz
Modeling and prediction of smart power semiconductor lifetime data using a gaussian process prior.
WSC
(2014)
Olivia Bluder
,
Kathrin Plankensteiner
,
Michael Nelhiebel
,
Walther Heinz
,
Christian Leitner
Modeling fatigue life of power semiconductor devices with ε-N fields.
WSC
(2014)
Anja Zernig
,
Olivia Bluder
,
Jürgen Pilz
,
Andre Kästner
Device level maverick screening: detection of risk devices through independent component analysis.
WSC
(2014)
Olivia Bluder
,
Michael Glavanovics
,
Jürgen Pilz
Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability.
Microelectron. Reliab.
51 (9-11) (2011)