Markov random fields for pattern extraction in analog wafer test data.
Stefan SchrunnerOlivia BluderAnja ZernigAndre KästnerRoman KernPublished in: IPTA (2017)
Keyphrases
- test data
- markov random field
- pattern extraction
- post processing
- pattern discovery
- graph cuts
- training data
- test cases
- image segmentation
- mrf model
- pairwise
- higher order
- maximum a posteriori
- random fields
- test set
- data sets
- association rule mining
- training set
- text mining
- infrared images
- piecewise constant functions
- multiscale
- image processing
- databases
- multi label
- error rate
- preprocessing
- genetic algorithm
- information retrieval
- machine learning