Quantification and Prediction of Damage in SAM Images of Semiconductor Devices.

Dzenana Alagic Olivia Bluder Jürgen Pilz

Published in: ICIAR (2018)

Keyphrases

image data
image database
image classification
input image
test images
image features
edge detection
ground truth
three dimensional
quantitative evaluation
image collections
image registration
control system
image analysis
prediction accuracy
image matching
image retrieval
object recognition
prediction error
semiconductor devices
feature points
computer aided
region of interest
segmentation method
image regions
case study
rigid body