Jürgen Pilz

Publication Activity (10 Years)

Years Active: 2007-2022
Publications (10 Years): 18

Top Topics

Semiconductor Manufacturing

Variational Inference

Ensemble Feature Selection

Top Venues

Qual. Reliab. Eng. Int.

Publications

Anna Jenul, Stefan Schrunner, Jürgen Pilz, Oliver Tomic
A user-guided Bayesian framework for ensemble feature selection in life science applications (UBayFS). Mach. Learn. 111 (10) (2022)
Christina Petschnigg, Markus Spitzner, Lucas Weitzendorf, Jürgen Pilz
From a Point Cloud to a Simulation Model: Bayesian Segmentation and Entropy based Uncertainty Estimation for 3D Modelling. CoRR (2021)
Anna Jenul, Stefan Schrunner, Jürgen Pilz, Oliver Tomic
A User-Guided Bayesian Framework for Ensemble Feature Selection in Life Science Applications (UBayFS). CoRR (2021)
Christina Petschnigg, Markus Spitzner, Lucas Weitzendorf, Jürgen Pilz
From a Point Cloud to a Simulation Model - Bayesian Segmentation and Entropy Based Uncertainty Estimation for 3D Modelling. Entropy 23 (3) (2021)
Konstantin Posch, Jürgen Pilz
Correlated Parameters to Accurately Measure Uncertainty in Deep Neural Networks. IEEE Trans. Neural Networks Learn. Syst. 32 (3) (2021)
Daniel Kurz, Horst Lewitschnig, Jürgen Pilz
Flexible time reduction method for burn-in of high-quality products. Qual. Reliab. Eng. Int. 37 (6) (2021)
Konstantin Posch, Maximilian Arbeiter, Jürgen Pilz
A novel Bayesian approach for variable selection in linear regression models. Comput. Stat. Data Anal. 144 (2020)
Christina Petschnigg, Jürgen Pilz
Uncertainty Estimation in Deep Neural Networks for Point Cloud Segmentation in Factory Planning. CoRR (2020)
Konstantin Posch, Christian Truden, Philipp Hungerländer, Jürgen Pilz
A Bayesian Approach for Predicting Food and Beverage Sales in Staff Canteens and Restaurants. CoRR (2020)
Martin Pleschberger, Stefan Schrunner, Jürgen Pilz
An Explicit Solution for Image Restoration using Markov Random Fields. J. Signal Process. Syst. 92 (2) (2020)
Jan Steinbrener, Konstantin Posch, Jürgen Pilz
Measuring the Uncertainty of Predictions in Deep Neural Networks with Variational Inference. Sensors 20 (21) (2020)
Konstantin Posch, Jürgen Pilz
Correlated Parameters to Accurately Measure Uncertainty in Deep Neural Networks. CoRR (2019)
Konstantin Posch, Jan Steinbrener, Jürgen Pilz
Variational Inference to Measure Model Uncertainty in Deep Neural Networks. CoRR (2019)
Ran Wang, Jingyu Lin, Bo Zhao, Lu Li, Zhouxuan Xiao, Jürgen Pilz
Integrated Approach for Lithological Classification Using ASTER Imagery in a Shallowly Covered Region - The Eastern Yanshan Mountain of China. IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens. 11 (12) (2018)
Dzenana Alagic, Jürgen Pilz
Unsupervised Algorithm to Detect Damage Patterns in Microstructure Images of Metal Films. IPAS (2018)
Dzenana Alagic, Olivia Bluder, Jürgen Pilz
Quantification and Prediction of Damage in SAM Images of Semiconductor Devices. ICIAR (2018)
Shirin Riazy, Tilo Wendler, Jürgen Pilz, Martin Glos, Thomas Penzel
Heuristic Approximation of the MAP Estimator for Automatic Two-channel Sleep Staging. BIOSIGNALS (2017)
Muhammad Mohsin, Jürgen Pilz, Albrecht Gebhardt
An Explicit Distribution to Model the Proportion of Heating Degree Day and Cooling Degree Day. Commun. Stat. Simul. Comput. 45 (7) (2016)
Daniel Kurz, Cristina De Luca, Jürgen Pilz
A Sampling Decision System for Virtual Metrology in Semiconductor Manufacturing. IEEE Trans Autom. Sci. Eng. 12 (1) (2015)
Daniel Kurz, Horst Lewitschnig, Jürgen Pilz
An advanced area scaling approach for semiconductor burn-in. Microelectron. Reliab. 55 (1) (2015)
Daniel Kurz, Horst Lewitschnig, Jürgen Pilz
Survey of recent advanced statistical models for early life failure probability assessment in semiconductor manufacturing. WSC (2014)
Daniel Kurz, Horst Lewitschnig, Jürgen Pilz
Advanced Bayesian Estimation of Weibull Early Life Failure Distributions. Qual. Reliab. Eng. Int. 30 (3) (2014)
Kathrin Plankensteiner, Olivia Bluder, Jürgen Pilz
Modeling and prediction of smart power semiconductor lifetime data using a gaussian process prior. WSC (2014)
Daniel Kurz, Horst Lewitschnig, Jürgen Pilz
Decision-Theoretical Model for Failures Which are Tackled by Countermeasures. IEEE Trans. Reliab. 63 (2) (2014)
Muhammad Mohsin, Hannes Kazianka, Jürgen Pilz, Albrecht Gebhardt
A new bivariate exponential distribution for modeling moderately negative dependence. Stat. Methods Appl. 23 (1) (2014)
Daniel Kurz, Jürgen Pilz, Andrea Schirru, Simone Pampuri, Cristina De Luca
A sampling decision system for semiconductor manufacturing: relying on virtual metrology and actual measurements. WSC (2014)
Anja Zernig, Olivia Bluder, Jürgen Pilz, Andre Kästner
Device level maverick screening: detection of risk devices through independent component analysis. WSC (2014)
Muhammad Mohsin, Hannes Kazianka, Jürgen Pilz
Likelihood and objective Bayesian modeling of acidity and major ions in rainfall using a bivariate pseudo-Gamma distribution. Comput. Geosci. 54 (2013)
Daniel Kurz, Cristina De Luca, Jürgen Pilz
Monitoring virtual metrology reliability in a sampling decision system. CASE (2013)
Daniel Kurz, Cristina De Luca, Jürgen Pilz
Sampling Decision System in semiconductor manufacturing using Virtual Metrology. CASE (2012)
O. P. Baume, Albrecht Gebhardt, C. Gebhardt, Gerard B. M. Heuvelink, Jürgen Pilz
Network optimization algorithms and scenarios in the context of automatic mapping. Comput. Geosci. 37 (3) (2011)
Daniel Kurz, Johannes Kaspar, Jürgen Pilz
Dynamic Maintenance in semiconductor manufacturing using Bayesian networks. CASE (2011)
Hannes Kazianka, Jürgen Pilz
Bayesian spatial modeling and interpolation using copulas. Comput. Geosci. 37 (3) (2011)
Edzer J. Pebesma, Dan Cornford, Grégoire Dubois, Gerard B. M. Heuvelink, Dionissios T. Hristopulos, Jürgen Pilz, Ulrich Stöhlker, Gary Morin, Jon O. Skøien
INTAMAP: The design and implementation of an interoperable automated interpolation web service. Comput. Geosci. 37 (3) (2011)
Grégoire Dubois, Dan Cornford, Dionissios T. Hristopulos, Edzer J. Pebesma, Jürgen Pilz
Introduction to this special issue on geoinformatics for environmental surveillance. Comput. Geosci. 37 (3) (2011)
Olivia Bluder, Michael Glavanovics, Jürgen Pilz
Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability. Microelectron. Reliab. 51 (9-11) (2011)
Hannes Kazianka, Raimund Leitner, Jürgen Pilz
Segmentation and Classification of Hyper-Spectral Skin Data. GfKl (2007)