Survey of recent advanced statistical models for early life failure probability assessment in semiconductor manufacturing.
Daniel KurzHorst LewitschnigJürgen PilzPublished in: WSC (2014)
Keyphrases
- statistical models
- semiconductor manufacturing
- statistical model
- statistical modeling
- discrete event simulation
- process control
- failure rate
- parameter estimation
- probability distribution
- least squares
- recent trends
- conditional probabilities
- bayesian models
- control system
- statistical methods
- knowledge base
- expert systems
- image segmentation