Horst Lewitschnig

Publication Activity (10 Years)

Years Active: 2011-2023
Publications (10 Years): 8

Top Topics

Countermeasures

Statistical Model

Semiconductor Manufacturing

Sampling Strategies

Top Venues

IEEE Trans. Reliab.

Qual. Reliab. Eng. Int.

Microelectron. Reliab.

Publications

Giovanni Di Nuzzo, Horst Lewitschnig, Marc Tuellmann, Sven Rzepka, Alexander Otto
A Data-driven Condition Monitoring method to predict the Remaining Useful Life of SiC Power Modules for Traction Inverters. ICPHM (2023)
Franz Wotawa, Horst Lewitschnig
Monitoring Hierarchical Systems for Safety Assurance. IDC (2021)
Daniel Kurz, Horst Lewitschnig, Jürgen Pilz
Flexible time reduction method for burn-in of high-quality products. Qual. Reliab. Eng. Int. 37 (6) (2021)
Wolfgang Granig, Stefan Jaksic, Horst Lewitschnig, Cristinel Mateis, Dejan Nickovic
Weakness Monitors for Fail-Aware Systems. FORMATS (2020)
Horst Lewitschnig, Armin Fanzott
Fractional Failures Sampling - An Alternative to Zero Failures Sampling Plans. IEEE Trans. Reliab. 68 (2) (2019)
Vera Hofer, Johannes Leitner, Horst Lewitschnig, Thomas Nowak
Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data. Qual. Reliab. Eng. Int. 33 (8) (2017)
Daniel Kurz, Horst Lewitschnig, Jürgen Pilz
An advanced area scaling approach for semiconductor burn-in. Microelectron. Reliab. 55 (1) (2015)
Horst Lewitschnig
Advances on the Stress Interaction Model. IEEE Trans. Reliab. 64 (1) (2015)
Daniel Kurz, Horst Lewitschnig, Jürgen Pilz
Survey of recent advanced statistical models for early life failure probability assessment in semiconductor manufacturing. WSC (2014)
Daniel Kurz, Horst Lewitschnig, Jürgen Pilz
Advanced Bayesian Estimation of Weibull Early Life Failure Distributions. Qual. Reliab. Eng. Int. 30 (3) (2014)
Daniel Kurz, Horst Lewitschnig, Jürgen Pilz
Decision-Theoretical Model for Failures Which are Tackled by Countermeasures. IEEE Trans. Reliab. 63 (2) (2014)
V. Müller, Horst Lewitschnig, N. Kortik, Werner Kanert
Quality assurance in automotive electronics. Elektrotech. Informationstechnik 128 (10) (2011)