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Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data.

Vera HoferJohannes LeitnerHorst LewitschnigThomas Nowak
Published in: Qual. Reliab. Eng. Int. (2017)
Keyphrases
  • case study
  • semiconductor devices
  • electron beam
  • data sets
  • failure rate
  • database
  • neural network
  • artificial intelligence
  • website
  • highly reliable
  • reliability assessment