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Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data.
Vera Hofer
Johannes Leitner
Horst Lewitschnig
Thomas Nowak
Published in:
Qual. Reliab. Eng. Int. (2017)
Keyphrases
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case study
semiconductor devices
electron beam
data sets
failure rate
database
neural network
artificial intelligence
website
highly reliable
reliability assessment