Andrea Schirru

Publication Activity (10 Years)

Years Active: 2010-2018
Publications (10 Years): 4

Top Topics

Machine Learning

Semiconductor Manufacturing

Decision Support

Regularization Methods

Top Venues

IEEE Trans. Ind. Informatics

Comput. Oper. Res.

Publications

Gian Antonio Susto, Matteo Terzi, Chiara Masiero, Simone Pampuri, Andrea Schirru
A Fraud Detection Decision Support System via Human On-Line Behavior Characterization and Machine Learning. AI4I (2018)
Gian Antonio Susto, Andrea Schirru, Simone Pampuri, Seán F. McLoone
Supervised Aggregative Feature Extraction for Big Data Time Series Regression. IEEE Trans. Ind. Informatics 12 (3) (2016)
Gian Antonio Susto, Andrea Schirru, Simone Pampuri, Seán F. McLoone, Alessandro Beghi
Machine Learning for Predictive Maintenance: A Multiple Classifier Approach. IEEE Trans. Ind. Informatics 11 (3) (2015)
Gian Antonio Susto, Simone Pampuri, Andrea Schirru, Alessandro Beghi, Giuseppe De Nicolao
Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach. Comput. Oper. Res. 53 (2015)
Daniel Kurz, Jürgen Pilz, Andrea Schirru, Simone Pampuri, Cristina De Luca
A sampling decision system for semiconductor manufacturing: relying on virtual metrology and actual measurements. WSC (2014)
Gian Antonio Susto, Andrea Schirru, Simone Pampuri, Daniele Pagano, Seán F. McLoone, Alessandro Beghi
A predictive maintenance system for integral type faults based on support vector machines: An application to ion implantation. CASE (2013)
Gian Antonio Susto, Seán F. McLoone, Daniele Pagano, Andrea Schirru, Simone Pampuri, Alessandro Beghi
Prediction of integral type failures in semiconductor manufacturing through classification methods. ETFA (2013)
Simone Pampuri, Andrea Schirru, Gian Antonio Susto, Cristina De Luca, Alessandro Beghi, Giuseppe De Nicolao
Multistep virtual metrology approaches for semiconductor manufacturing processes. CASE (2012)
Gian Antonio Susto, Andrea Schirru, Simone Pampuri, Giuseppe De Nicolao, Alessandro Beghi
An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control. CASE (2012)
Andrea Schirru, Gian Antonio Susto, Simone Pampuri, Seán F. McLoone
Learning from time series: Supervised Aggregative Feature Extraction. CDC (2012)
Simone Pampuri, Andrea Schirru, Cristina De Luca, Giuseppe De Nicolao
Proportional hazard model with ℓ1 Penalization applied to Predictive Maintenance in semiconductor manufacturing. CASE (2011)
Andrea Schirru, Simone Pampuri, Cristina De Luca, Giuseppe De Nicolao
Nonparametric Virtual Sensors for Semiconductor Manufacturing - Using Information Theoretic Learning and Kernel Machines. ICINCO (2) (2011)
Simone Pampuri, Andrea Schirru, Giuseppe Fazio, Giuseppe De Nicolao
Multilevel Lasso applied to Virtual Metrology in semiconductor manufacturing. CASE (2011)
Andrea Schirru, Simone Pampuri, Giuseppe De Nicolao
Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing. CASE (2010)
Andrea Schirru, Simone Pampuri, Giuseppe De Nicolao
Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing. CASE (2010)