Proportional hazard model with ℓ1 Penalization applied to Predictive Maintenance in semiconductor manufacturing.
Simone PampuriAndrea SchirruCristina De LucaGiuseppe De NicolaoPublished in: CASE (2011)
Keyphrases
- conceptual model
- database
- computational model
- semiconductor manufacturing
- statistical model
- mathematical model
- probabilistic model
- theoretical framework
- formal model
- management system
- data sets
- markov chain
- theoretical analysis
- evolutionary algorithm
- bayesian networks
- high level
- neural network
- sensitivity analysis
- classification models
- risk assessment