Login / Signup
Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability.
Olivia Bluder
Michael Glavanovics
Jürgen Pilz
Published in:
Microelectron. Reliab. (2011)
Keyphrases
</>
statistical models
statistical inference
probabilistic model
data sets
statistical analysis
knowledge base
parametric models
semiconductor manufacturing
statistical model
information theoretic
statistical methods
posterior probability
bayesian methods
statistical approaches
goodness of fit